Part Average Testing (PAT) helps to solve reliability and quality problems trying to meet the strict
requirements of the automotive industry.
In wafer probe, a post-processing analysis, or an analysis just when the last
die has been tested is usually the approached followed. However, this needs to be
done in real-time for most final-test handlers.
Brief PAT Primer
The highlighted die below is within the test limits,
and consequently is a passing die. However, it's an unusual die and so
it should be failed!
There are several solutions available for PAT. Click here or on the logo below for details
on Mfg Vision's approach on applying PAT to selected products on your floor.
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