We have developed PATVision
to help you solve reliability and quality problems trying to meet the strict
requirements of the automotive industry.
In wafer probe, a post-processing analysis, or an analysis just when the last
die has been tested is usually the approached followed. However, this needs to be
done in real-time for most final-test handlers.
Static Limits / Dynamic Limits
For the selected products, you need to set static limits. These
are set by the engineer, or if you have a smart system, they can
automatically be set based on historical analysis.
Once testing starts, a smart system will use dynamic limits which adjust
to the current lot's distribution, recalculated on the fly as testing is
happening.
Solution
There are other solutions available that set the static limits within the
test program. This means:
- They make messy test program updates in the sequencer.
- You would need to make changes in your test program every time you change your PAT limits
This mess is not neccessary. With PATVision
you just need:
- A minor test program change
- No sequencer changes!
- A web browser to do PAT simulations, and confortably change limits or choose a specific algorithm whenever you want
Additional Features
As in FloorVision,
there are inbuilt SMS/E-mail alerts, and a simple web-based interface to interact with your PAT-enabled products.
A beta release is now available for Teradyne Image testers.
Contact us at info@mfgvision.com or click here to request a call
for a preliminary discussion
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