|
 |
| |
What is FloorVision
FloorVision is a powerful and innovative Semiconductor Yield Analysis and Semiconductor Yield Management system. Allows fast test data analysis, so product and test engineers will use it and get results very quickly. The user experience is of a web 2.0 application which makes each web-page interactive and lends itself to collaboration. The consequences are faster ramp-ups, higher yield and lower manufacturing costs.
Key Features
- Thin client model
- Semiconductor test data (e.g. STDF files) is processed with unparalleled speed into an extremely efficient
database design
- Test data analysis with no installations. Just use any web browser to create powerful reports and charts to visualize
trends, across lots, products and between any given time frame
- Fast data analysis: done within seconds, always, even if you are asking for analysis of
hundreds of thousands of dice
- Down to per-test multi-site histograms of thousands of units can be generated within a fraction of a second (literally!)
With FloorVision engineers no longer concern yourself with searching for and moving around raw test production data. We set up the raw data pipeline to a central server, which you can host or we can host if you don’t want to have any IT overhead. Our processes run on this central server, storing relevant information on the server about each datalog which comes in from a subcon.
We link each lot-id from test back to probe and fab so the user can immediately correlate any Final test performance issues back to Fab or Probe.
FloorVision is chart-oriented and also includes all the relevant statistics. Navigation is simple from high-level production reports to lower level engineering analysis and across from Fab to Probe to Test.
It is generally no more than two or three clicks and no more than a few seconds from the reporting section to the true explanation of a yield issue.
What makes FloorVision unique?
- Visibility and control: take control of your testing, know what's happening,
see trends, and information that you have never seen before. FloorVision
makes available as much information as possible as soon as it is available!
- Speed:all your histograms, cumulative plots, trends, etc.
will be generated in seconds.
- Thin-Client: no need to store large amounts of data on your workstation or PC. All raw data is centrally stored and indexed. You just retrieve analysis results and visual charts
- Minimalist yet powerful: we don't believe that fancy and extremely heavy graphics
will help you be more productive, if you have to wait for loading. We've made sure there's a functional and minimalistic design,
the fastest graphic libraries are used and simplicity of use.
Features of FloorVision
-
Production Reports:
- Drill-down reports of actual production quantities and actual yields
- Linked directly to parametric information to the level available from the data generated by the tester/prober.
-
Interactive Charts:
- ANOVA
- Histograms, cumulative plots, X/Y charts
- Yield Trend Charts, Bin Trends etc.
- Wafer galleries, comprehensive zonal analysis
-
Collaboration
- Blog technology
- Enviroment to encourage team learning
-
Multi-file Analysis
- Analyse multiple parametric files interactively on the web
-
Characterization
- One-click interactive report generation
Integration / Add-Ons
If in addition you are interested in real-time, a seamless real-time parametric reader can integrate into FloorVision.
Awards
The real-time technology won a Best Paper Award at the
Teradyne Users Group conference (TUG 2006), in Florida.
|
|
 |
|
|
|
 |
|
|
|
|
 |
- Yield Management Solutions
- Test Characterization Reports
- Test Cost Reduction
- STDF Tool Development
|
 |
|
|
|
|
|
