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For Start Ups and Individual Engineers


Control your yields and analyze your STDF files and other test data files with FloorVision On-Demand, with 4 simple steps:
  • Get an account! Contact us for a free 7-days evaluation
  • Upload your files and keep them there
  • Process them in minutes
  • Analyze them at lightning speed from anywhere
Our system's key features are:
  • Thin client model, you simply need a browser
  • Process data (e.g. STDF files) with unparalleled speed into an extremely efficient database
  • Use any web browser to create powerful reports and charts to analyze your files
  • This is done within seconds, always, even if you are asking for analysis of hundreds of thousands of dice
  • Down to per-test multi-site histograms of thousands of units can be generated within a fraction of a second (literally!)

This is an ideal solution for small companies and individual engineers, who can now also avail of the full power of our enterprise parametric analysis based on FloorVision: a powerful and easy to use web interface for parametrics and historical analysis which comes in two options:
  • Standard Edition, full featured test data analysis tool
  • Gold Edition, which in addition includes Characterization analysis


Click here or on the logo below for a detailed description of this technology.


FloorVision
  Enterprise Yield Management
  Semiconductor Test Data Analysis
PATVision
  Part Average Testing (PAT)
Resources
-Brochures, manuals, etc.
-Whitepapers
-Software Evaluation

- Yield Management Solutions
- Test Characterization Reports
- Test Cost Reduction
- STDF Tool Development