The ability to catch semiconductor test and wafer sort production problems (problem bins, excessive yield loss, idle testers) in real time is obviously desirable in high volume production to maximise tester utilisation. Until now this has been awkward and expensive. Short of having an operator per tester, complex software and hardware has to be installed… Read more »
Our new product yieldHUB is now being beta tested in the field. It combines sophisticated data and yield analysis capabilities with social networking technology. Never again have information stuck in someone’s email thread. Keep it all on-line in a secure fire-walled web application. More information about yieldHUB will follow. Please contact email@example.com or phone us… Read more »
As an engineer with no spare time in your hands for unnecessarily searching for data, you want to have up-to-date information about your new product’s production yield, parametric and bin performance in seconds before you go into your next meeting. You may even want the information, up to the minute, during your meeting, in dashboard… Read more »
You are probably familiar with thick client data analysis companies offering a free trial for a month, where you DOWNLOAD their software into your computer. After a month, you can purchase or the temporary license expires. Well, we offer the opposite! You can UPLOAD a few gigabytes of STDF and PCM(WAT) data over a month… Read more »
FloorVision 3.1 is being released in September 2010. It includes new capabilities and is much faster when plotting histograms of hundreds of thousands of units. New optional features include, but are not limited to, the following: * Complex Rules for Emailed Alerts. Designed for busy engineers needing to trap issues in high volume manufacturing. * … Read more »
FloorVision 3.0 has been released to all customers during November 2009. It includes breakthrough capabilities and a fresher and more configurable User Interface. New features include, but are not limited to, the following: * Gage R&R * Calculated(Virtual) Tests * Shareable Reports * IQR-based filtering * Wafer-level genealogy * SAP support * Smart ANOVA *… Read more »
Full suite of Enterprise Parametric Analysis is now integrated in FloorVision! Including correlation tools across Fab, Test and Wafer Probe. First on-site demo has taken place at a potential customer using their data.
Mfg Vision Ltd has released Real-Time SPC, a software product for real-time statistical monitoring and control of mixed-signal semiconductor test. John O’Donnell, CEO of Mfg Vision Ltd, headquartered in Limerick, Ireland (with a second office in Bohol, the Philippines), says that “Situations of out-of-control binning or parametric performance should generate alerts on a test floor,… Read more »