FloorVision 3.1 is being released in September 2010. It includes new capabilities and is much faster when plotting histograms of hundreds of thousands of units. New optional features include, but are not limited to, the following: *  Complex Rules for Emailed Alerts. Designed for busy engineers needing to trap issues in high volume manufacturing. *  [...]

FloorVision 3.0 has been released to all customers during November 2009. It includes breakthrough capabilities and a fresher and more configurable User Interface. New features include, but are not limited to, the following: * Gage R&R * Calculated(Virtual) Tests  * Shareable Reports * IQR-based filtering  * Wafer-level genealogy * SAP support * Smart ANOVA * [...]

Full suite of Enterprise Parametric Analysis is now integrated in FloorVision! Including correlation tools across Fab, Test and Wafer Probe. First on-site demo has taken place at a potential customer using their data.

Mfg Vision Ltd has released Real-Time SPC, a software product for real-time statistical monitoring and control of mixed-signal semiconductor test. John O’Donnell, CEO of Mfg Vision Ltd, headquartered in Limerick, Ireland (with a second office in Bohol, the Philippines), says that “Situations of out-of-control binning or parametric performance should generate alerts on a test floor, [...]