by Jerome Auza, Director of Engineering , MFG Vision The Challenge Being in the realm of semiconductor data with a wide range of customers, companies often throw interesting technical challenges at us. The most complex one so far this year is probably a request (OK, a requirement!) to interpret binary test datalog files so that they can… Read more »
Ramp your Multi-site Test Yield Faster with “Test Environment” Gage R&R by Kevin Robinson, Director of Customer Success, MFG Vision Gage R&R has been used for many years in the semiconductor industry to measure variation during test for repeatability and reproducibility. These measurements are then used to assess the suitability of the test for production…. Read more »
Here’s an overview of our customer types who come from many countries around the world: High profile international conglomerates who have semiconductor divisions often supplying chips to their own divisions, who like to have a system that helps them analyse millions of chips a month Fast growing fabless start-up companies who want to concentrate on… Read more »
Are you displaying the right level of data to see the information that you need to get at? Here is a great example of using the appropriate level of detail.
Is it ever worth re-inventing the wheel? Every industry outsources key functions over time. Airlines outsource baggage handling, construction companies outsource pipe-laying. Many fast growing technology companies outsource enterprise software and many are tempted to build their own. Yield Management Software (“YMS”) is no different. Why have a YMS system at all? Whether built internally or… Read more »
There is an interesting trend in growth in the size of datasets that customers want to use for trials of our semiconductor yield management software.
One of our Semiconductor Yield Management customers hasn’t logged into their yieldHUB system for a couple of months. On the other hand, their data pipeline adds multiple Gigabytes of STDF and WAT/PCM data every month to the database and they swear by the system. How is it that they rarely log in, yet value yieldHUB so highly? The… Read more »
Last week at the ITC 2016 in Dallas Fort Worth we explained to visitors to our booth how yieldHUB “learns with you”. Right from the get-go using the yieldHUB platform you will be able to add your knowledge of any product and yieldHUB will add to its knowledge base. This is the kind of knowledge that speeds… Read more »
Huge growth in automotive electronics leaves many asking questions about part average testing, read on for an interesting insight into who should control it…
If you are a Fabless start-up and are ramping, you will struggle without some sort of analysis capability for your data in production. You can decide to purchase a system that manages all the data, or alternatively, manage the data yourself and hire an engineer whose job it is to generate reports from the data…. Read more »