MFG Vision Limited was incorporated in 2005 to address a gap in the market for cost-effective and efficient analysis of semiconductor test data.
We introduced out first real-time product “PatVision” in 2006. This was the first final test real-time PAT solution and Infineon was our lead customer. Since then the method has been adopted worldwide as a standard Parts Average Testing algorithm for Final Test where you have only one chance to fail a die that looks unreliable.
We introduced out first web-based product “FloorVision” in 2007. Lead customers were fabless companies and were soon followed by IDMs. By 2009 multiple companies had hundreds of users benefitting from FloorVision.
A new platform was launched in 2013 by the name of yieldHUB. This was the first semiconductor YMS platform to combine powerful analytical tools with concepts from social networking.