If your current semiconductor production datalog analysis system is cumbersome and slowing down the speed with which your engineers can make informed decisions affecting yield, quality, reliability and throughput, you have come to the right place. Our private cloud Yield Management System "FloorVision" will keep you right up to date with production and provide you with instant analysis which is not possible with traditional data models.

Detailed semiconductor yield analysis and reporting down to the parametric and die level, which in the past took weeks or days, now takes minutes or seconds, significantly raising the productivity of product, process and test engineers. This is accomplished through the deployment of a central relational database which contains and links up all manufacturing data. One-click tools are provided via the web to do all kinds of standard and sophisticated analyses, including correlating parametric performance across manufacturing stages.

Contact us at info{at}mfgvision{dot}com or +353 61 309745 if you wish to see how our state-of-the-art technology can transform the productivity of your engineering teams whether to introduce new products robustly or manage volume production.

“The Graphical and Statistical STDF data analysis and PCM or WAT Data Analysis are both user-friendly and very powerful ... the products and support by Mfg Vision have been outstanding" - From a 2010 quote by Foundry Director, Cirrus Logic Inc, a customer of Mfg Vision since 2007.

Cumulative Plot How a parameter varies across a wafer Histogram

The comprehensive tool-set for analyzing your STDF and PCM or WAT data is available using any modern browser with no additional software needed.

Analyzing STDF Data? Unique Test Numbers Can Improve Productivity
This is my site Written by jerome.auza on May 17, 2012 – 9:54 am

The Standard Test Datalog Format or STDF was developed by Teradyne, Inc. and has become some sort of a de facto standard data format for test systems. Most semiconductor yield management and analysis systems support the STDF format. The data structure was designed for efficient datalogging while testing. It is very flexible and can actually [...]

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